The high performing pickup with a measurement range of 1,000 μm and a Z-axis minimum resolution of 0,0001 μm allows for wide-range and high resolution skidless measurement. No need to consider measurement range.
In addition to flat surface, the roughness or waviness on undulating surface such as stepped or round surface can be evaluated with one trace. Leveling and zeroing before measurement can also be performed easily.

• SURFCOM TOUCH 550

Equipped with a high performing pickup having high resolution and wide range.
It offers high flexibility where granite base size, column height, and X-axis drive range can be selected depending on needs.

Extended Z-axis measurement range from 800 to 1,000 μm (25% increase)

The high performing pickup with a measurement range of 1,000 μm and a z-axis minimum resolution of 0,0001 μm allows for wide-range and high resolution skidless measurement. No need to consider measurement range. In addition to flat surface, the roughness or waviness on undulating surface such as stepped or round surface can be evaluated with one trace. Leveling and zeroing before measurement can also be performed easily.

All roughness testers MICROTECH pass metrological control in accredited by ISO17025 metrological laboratory.