Currently, MICROTECH® offers a range of instruments and surface roughness samples:

1. Supporting profilers PM-210 and PM-300, allowing to determine the parameters of surface roughness.

2. Profile non-support contact devices (PM-500 profilometers), which allow measuring surface roughness, waviness and shape error.

3. All MICROTECH® devices have:

a set of filters and parameters for data analysis;
interchangeable sensors, a wide range of probes, extension cords and other devices;
can generate filtered and unfiltered profiles;
have the ability to connect to a PC via RS-232 and a USB port; measure clean and rough surfaces.
4. Samples of surface roughness, intended for comparison visually and to the touch (with a fingernail) with the surfaces of products obtained as a result of processing.

Roughness samples MICROTECH® ОШП and ОШУ are the cheapest available method for controlling surface roughness and are used mainly as a means of tolerance control. Rows of roughness samples ОШП and ОШУ are made using a processing method that should reproduce the sample.